4-1-3 氮化鎵元件可靠度衰減機制 (3): 常見Schottky, MIS, p-GaN HEMTs可靠度議題

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New channel NYCU EE Tian-Li Wu | Semiconductor Education: title sample judged 'whole' (Full lecture recordings, short courses, and modular tutorials on semiconductor physics, devices, and reliability from a ); passed a second screen for sellers/exam-prep/re-uploads; 0 of 3 sampled transcripts showed teaching, 0 not; titles picked one by one, checked strictly; oEmbed verified.

What you'll learn

A 10-minute video from NYCU EE Tian-Li Wu | Semiconductor Education: “4-1-3 氮化鎵元件可靠度衰減機制 (3): 常見Schottky, MIS, p-GaN HEMTs可靠度議題”.

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